Transmission Electron Microscopy

Transmission Electron Microscopy

AngličtinaPevná väzba
Reimer Ludwig
Springer-Verlag New York Inc.
EAN: 9780387400938
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Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the forth edition have been updated again. USP: -Standard reference book -Now updated by the successor of the original author -New topics of the field included -Gives a comprehensive review of recent progresses in TEM
EAN 9780387400938
ISBN 0387400931
Typ produktu Pevná väzba
Vydavateľ Springer-Verlag New York Inc.
Dátum vydania 28. augusta 2008
Stránky 590
Jazyk English
Rozmery 235 x 155
Krajina United States
Čitatelia Professional & Scholarly
Autori Kohl Helmut; Reimer Ludwig
Ilustrácie XVI, 590 p. 276 illus.
Edícia Fifth Edition 2008
Séria Springer Series in Optical Sciences
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