Transmission Electron Microscopy

Transmission Electron Microscopy

AngličtinaMäkká väzbaTlač na objednávku
Reimer Ludwig
Springer-Verlag New York Inc.
EAN: 9781441923080
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Podrobné informácie

The aim of this monograph is to outline the physics of image formation, electron–specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.
EAN 9781441923080
ISBN 144192308X
Typ produktu Mäkká väzba
Vydavateľ Springer-Verlag New York Inc.
Dátum vydania 19. novembra 2010
Stránky 590
Jazyk English
Rozmery 235 x 155
Krajina United States
Čitatelia Professional & Scholarly
Autori Kohl Helmut; Reimer Ludwig
Ilustrácie XVI, 590 p. 276 illus.
Edícia Softcover reprint of hardcover 5th ed. 2008
Séria Springer Series in Optical Sciences