Electromigration Modeling at Circuit Layout Level

Electromigration Modeling at Circuit Layout Level

EnglishPaperback / softbackPrint on demand
Tan, Cher Ming
Springer Verlag, Singapore
EAN: 9789814451208
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EAN 9789814451208
ISBN 9814451207
Binding Paperback / softback
Publisher Springer Verlag, Singapore
Publication date May 4, 2013
Pages 103
Language English
Dimensions 235 x 155
Country Singapore
Authors He Feifei; Tan, Cher Ming
Illustrations 2 Illustrations, color; 73 Illustrations, black and white
Edition 2013 ed.
Series SpringerBriefs in Reliability
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