Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy

EnglishPaperback / softback
Lyman Charles E.
Springer Science+Business Media
EAN: 9780306435911
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EAN 9780306435911
ISBN 0306435918
Binding Paperback / softback
Publisher Springer Science+Business Media
Publication date August 31, 1990
Pages 407
Language English
Dimensions 244 x 170
Country United States
Readership Professional & Scholarly
Authors Armstrong, John; Echlin Patrick; Fiori Charles; Goldstein, Joseph; Joy, David C.; Lifshin Eric; Lyman Charles E.; Newbury Dale E.; Peters, Klaus-Rudiger; Romig Jr., Alton D.; Williams David B.
Illustrations XI, 407 p.
Edition Softcover reprint of the original 1st ed. 1990
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