Transmission Electron Microscopy

Transmission Electron Microscopy

EnglishHardback
Reimer Ludwig
Springer-Verlag New York Inc.
EAN: 9780387400938
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Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the forth edition have been updated again. USP: -Standard reference book -Now updated by the successor of the original author -New topics of the field included -Gives a comprehensive review of recent progresses in TEM
EAN 9780387400938
ISBN 0387400931
Binding Hardback
Publisher Springer-Verlag New York Inc.
Publication date August 28, 2008
Pages 590
Language English
Dimensions 235 x 155
Country United States
Readership Professional & Scholarly
Authors Kohl Helmut; Reimer Ludwig
Illustrations XVI, 590 p. 276 illus.
Edition Fifth Edition 2008
Series Springer Series in Optical Sciences
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