Sampling, Wavelets, and Tomography

Sampling, Wavelets, and Tomography

EnglishPaperback / softbackPrint on demand
Springer-Verlag New York Inc.
EAN: 9781461264958
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EAN 9781461264958
ISBN 1461264952
Binding Paperback / softback
Publisher Springer-Verlag New York Inc.
Publication date October 4, 2012
Pages 344
Language English
Dimensions 235 x 155
Country United States
Readership Professional & Scholarly
Illustrations XXI, 344 p.
Editors Benedetto John J.; Zayed Ahmed I.
Edition Softcover reprint of the original 1st ed. 2004
Series Applied and Numerical Harmonic Analysis
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