Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

EnglishHardbackPrint on demand
Shen Ruijing
Springer-Verlag New York Inc.
EAN: 9781461407874
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EAN 9781461407874
ISBN 1461407877
Binding Hardback
Publisher Springer-Verlag New York Inc.
Publication date March 18, 2012
Pages 306
Language English
Dimensions 235 x 155
Country United States
Readership Professional & Scholarly
Authors Shen Ruijing; Tan, Sheldon X.-D.; Yu Hao
Illustrations XXX, 306 p.
Edition 2012
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