Trace-Based Post-Silicon Validation for VLSI Circuits

Trace-Based Post-Silicon Validation for VLSI Circuits

EnglishHardbackPrint on demand
Liu Xiao
Springer, Berlin
EAN: 9783319005324
Print on demand
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EAN 9783319005324
ISBN 3319005324
Binding Hardback
Publisher Springer, Berlin
Publication date June 27, 2013
Pages 108
Language English
Dimensions 235 x 155
Country Switzerland
Readership Professional & Scholarly
Authors Liu Xiao; Xu Qiang
Illustrations XV, 108 p. 59 illus., 38 illus. in color.
Edition 2013 ed.
Series Lecture Notes in Electrical Engineering
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