Noncontact Atomic Force Microscopy

Noncontact Atomic Force Microscopy

EnglishHardback
Springer, Berlin
EAN: 9783642014949
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EAN 9783642014949
ISBN 3642014941
Binding Hardback
Publisher Springer, Berlin
Publication date October 1, 2009
Pages 401
Language English
Dimensions 235 x 155
Country Germany
Readership Professional & Scholarly
Illustrations XVIII, 401 p. 105 illus., 77 illus. in color.
Editors Giessibl Franz J.; Morita Seizo; Wiesendanger, Roland
Edition 2009 ed.
Series NanoScience and Technology
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