Combinatorial Group Testing And Its Applications (2nd Edition)

Combinatorial Group Testing And Its Applications (2nd Edition)

EnglishHardback
Du, Ding-zhu (Univ Of Texas At Dallas, Usa)
World Scientific Publishing Co Pte Ltd
EAN: 9789810241070
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Group testing has been used in medical, chemical and electrical testing, coding, drug screening, pollution control, multiaccess channel management, and recently in data verification, clone library screening and AIDS testing. The mathematical model can be either combinatorial or probabilistic. This book summarizes all important results under the combinatorial model, and demonstrates their applications in real problems. Some other search problems, including the famous counterfeit-coins problem, are also studied in depth.There are two reasons for publishing a second edition of this book. The first is the usual need to update the text (after six years) and correct errors. The second — and more important — reason is to accommodate the recent sudden growth of interest in applying the idea of group testing to clone library screening. This development is much more than just a new application, since the new application brings with it new objectives which require a new twist of theory. It also embraces the growing importance of two topics: nonadaptive algorithms and error tolerance. Two new chapters, one on clone library screening and the other on error tolerance, have been added. Also included is a new chapter on counterfeit coins, the most famous search problem historically, which recently drew on an unexpected connection to some deep mathematical theory to yield new results. Finally, the chapters have been reorganized into parts to provide focuses and perspectives.
EAN 9789810241070
ISBN 9810241070
Binding Hardback
Publisher World Scientific Publishing Co Pte Ltd
Publication date December 29, 1999
Pages 336
Language English
Country Singapore
Authors Du, Ding-zhu (Univ Of Texas At Dallas, Usa); Hwang, Frank Kwang-ming (Nat'l Chiao-tung Univ, Taiwan)
Edition 2 Revised edition
Series Series On Applied Mathematics
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